Exact Feature Distribution Matching for Arbitrary Style Transfer and Domain Generalization

Yabin Zhang, Minghan Li, Ruihuang Li, Kui Jia, Lei Zhang; Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), 2022, pp. 8035-8045

Abstract


Arbitrary style transfer (AST) and domain generalization (DG) are important yet challenging visual learning tasks, which can be cast as a feature distribution matching problem. With the assumption of Gaussian feature distribution, conventional feature distribution matching methods usually match the mean and standard deviation of features. However, the feature distributions of real-world data are usually much more complicated than Gaussian, which cannot be accurately matched by using only the first-order and second-order statistics, while it is computationally prohibitive to use high-order statistics for distribution matching. In this work, we, for the first time to our best knowledge, propose to perform Exact Feature Distribution Matching (EFDM) by exactly matching the empirical Cumulative Distribution Functions (eCDFs) of image features, which could be implemented by applying the Exact Histogram Matching (EHM) in the image feature space. Particularly, a fast EHM algorithm, named Sort-Matching, is employed to perform EFDM in a plug-and-play manner with minimal cost. The effectiveness of our proposed EFDM method is verified on a variety of AST and DG tasks, demonstrating new state-of-the-art results. Codes are available at https://github.com/YBZh/EFDM.

Related Material


[pdf] [supp] [arXiv]
[bibtex]
@InProceedings{Zhang_2022_CVPR, author = {Zhang, Yabin and Li, Minghan and Li, Ruihuang and Jia, Kui and Zhang, Lei}, title = {Exact Feature Distribution Matching for Arbitrary Style Transfer and Domain Generalization}, booktitle = {Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR)}, month = {June}, year = {2022}, pages = {8035-8045} }