Efficient Unified Demosaicing for Bayer and Non-Bayer Patterned Image Sensors

Haechang Lee, Dongwon Park, Wongi Jeong, Kijeong Kim, Hyunwoo Je, Dongil Ryu, Se Young Chun; Proceedings of the IEEE/CVF International Conference on Computer Vision (ICCV), 2023, pp. 12750-12759

As the physical size of recent CMOS image sensors (CIS) gets smaller, the latest mobile cameras are adopting unique non-Bayer color filter array (CFA) patterns (e.g., Quad, Nona, QxQ), which consist of homogeneous color units with adjacent pixels. These non-Bayer sensors are superior to conventional Bayer CFA thanks to their changeable pixel-bin sizes for different light conditions, but may introduce visual artifacts during demosaicing due to their inherent pixel pattern structures and sensor hardware characteristics. Previous demosaicing methods have primarily focused on fixed pixel-bin sizes of Bayer CFA, requiring specialized reconstruction methods for non-Bayer patterned CIS and executing multiple CFA modes depending on lighting conditions. In this work, we propose an efficient unified demosaicing method that can be applied to both conventional Bayer RAW and various non-Bayer CFAs' RAW data in different operation modes. Our Knowledge Learning-based demosaicing model for Adaptive Patterns, namely KLAP, utilizes CFA-adaptive filters for only 1% key filters in the network for each CFA, but still manages to effectively demosaic all the CFAs, yielding comparable performance to the large-scale models. Furthermore, by employing meta-learning during inference (KLAP-M), our model is able to eliminate unknown sensor-generic artifacts in real RAW data, effectively bridging the gap between synthetic images and real sensor RAW. Our KLAP and KLAP-M methods achieved state-of-the-art demosaicing performance in both synthetic and real RAW data of Bayer and non-Bayer CFAs.