Deep Metric Learning to Rank

Fatih Cakir, Kun He, Xide Xia, Brian Kulis, Stan Sclaroff; The IEEE Conference on Computer Vision and Pattern Recognition (CVPR), 2019, pp. 1861-1870

Abstract


We propose a novel deep metric learning method by revisiting the learning to rank approach. Our method, named FastAP, optimizes the rank-based Average Precision measure, using an approximation derived from distance quantization. FastAP has a low complexity compared to existing methods, and is tailored for stochastic gradient descent. To fully exploit the benefits of the ranking formulation, we also propose a new minibatch sampling scheme, as well as a simple heuristic to enable large-batch training. On three few-shot image retrieval datasets, FastAP consistently outperforms competing methods, which often involve complex optimization heuristics or costly model ensembles.

Related Material


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[bibtex]
@InProceedings{Cakir_2019_CVPR,
author = {Cakir, Fatih and He, Kun and Xia, Xide and Kulis, Brian and Sclaroff, Stan},
title = {Deep Metric Learning to Rank},
booktitle = {The IEEE Conference on Computer Vision and Pattern Recognition (CVPR)},
month = {June},
year = {2019}
}