Lacunarity Analysis on Image Patterns for Texture Classification

Yuhui Quan, Yong Xu, Yuping Sun, Yu Luo; The IEEE Conference on Computer Vision and Pattern Recognition (CVPR), 2014, pp. 160-167

Abstract


Based on the concept of lacunarity in fractal geometry, we developed a statistical approach to texture description, which yields highly discriminative feature with strong robustness to a wide range of transformations, including photometric changes and geometric changes. The texture feature is constructed by concatenating the lacunarity-related parameters estimated from the multi-scale local binary patterns of image. Benefiting from the ability of lacunarity analysis to distinguish spatial patterns, our method is able to characterize the spatial distribution of local image structures from multiple scales. The proposed feature was applied to texture classification and has demonstrated excellent performance in comparison with several state-of-the-art approaches on four benchmark datasets.

Related Material


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[bibtex]
@InProceedings{Quan_2014_CVPR,
author = {Quan, Yuhui and Xu, Yong and Sun, Yuping and Luo, Yu},
title = {Lacunarity Analysis on Image Patterns for Texture Classification},
booktitle = {The IEEE Conference on Computer Vision and Pattern Recognition (CVPR)},
month = {June},
year = {2014}
}