A Randomized Ensemble Approach to Industrial CT Segmentation

Hyojin Kim, Jayaraman Jayaraman J. Thiagarajan, Peer-Timo Bremer; The IEEE International Conference on Computer Vision (ICCV), 2015, pp. 1707-1715

Abstract


Tuning the models and parameters of common segmentation approaches is challenging especially in the presence of noise and artifacts. Ensemble-based techniques attempt to compensate by randomly varying models and/or parameters to create a diverse set of hypotheses, which are subsequently ranked to arrive at the best solution. However, these methods have been restricted to cases where the underlying models are well-established, e.g. natural images. In practice, it is difficult to determine a suitable base-model and the amount of randomization required. Furthermore, for multi-object scenes no single hypothesis may perform well for all objects, reducing the overall quality of the results. This paper presents a new ensemble-based segmentation framework for industrial CT images demonstrating that comparatively simple models and randomization strategies can significantly improve the result over existing techniques. Furthermore, we introduce a per-object based ranking, followed by a consensus inference that can outperform even the best case scenario of existing hypothesis ranking approaches. We demonstrate the effectiveness of our approach using a set of noise and artifact rich CT images from baggage security and show that it significantly outperforms existing solutions in this area.

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[bibtex]
@InProceedings{Kim_2015_ICCV,
author = {Kim, Hyojin and Jayaraman Thiagarajan, Jayaraman J. and Bremer, Peer-Timo},
title = {A Randomized Ensemble Approach to Industrial CT Segmentation},
booktitle = {The IEEE International Conference on Computer Vision (ICCV)},
month = {December},
year = {2015}
}