Memory-Efficient Fine-Tuning Diffusion Transformers via Dynamic Patch Sampling and Block Skipping

Sunghyun Park, Jeongho Kim, Hyoungwoo Park, Debasmit Das, Sungrack Yun, Munawar Hayat, Jaegul Choo, Fatih Porikli, Seokeon Choi; Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), 2026, pp. 11504-11514

Diffusion Transformers (DiTs) have significantly enhanced text-to-image (T2I) generation quality, enabling high-quality personalized content creation. However, fine-tuning these models requires substantial computational complexity and memory, limiting practical deployment under resource constraints. To tackle these challenges, we propose a memory-efficient fine-tuning framework called DiT-BlockSkip, integrating timestep-aware dynamic patch sampling and block skipping by precomputing residual features. Our dynamic patch sampling strategy adjusts patch sizes based on the diffusion timestep, then resizes the cropped patches to a fixed lower resolution. This approach reduces forward & backward memory usage while allowing the model to capture global structures at higher timesteps and fine-grained details at lower timesteps. The block skipping mechanism selectively fine-tunes essential transformer blocks and precomputes residual features for the skipped blocks, significantly reducing training memory. To identify vital blocks for personalization, we introduce a block selection strategy based on cross-attention masking. Evaluations demonstrate that our approach achieves competitive personalization performance qualitatively and quantitatively, while reducing memory usage substantially, moving toward on-device feasibility (e.g., smartphones, IoT devices) for large-scale diffusion transformers.