M2SFormer: Multi-Spectral and Multi-Scale Attention with Edge-Aware Difficulty Guidance for Image Forgery Localization

Ju-Hyeon Nam, Dong-Hyun Moon, Sang-Chul Lee; Proceedings of the IEEE/CVF International Conference on Computer Vision (ICCV), 2025, pp. 15927-15938

Image editing techniques have rapidly advanced, facilitating both innovative use cases and malicious manipulation of digital images. Deep learning-based methods have recently achieved high accuracy in pixel-level forgery localization, yet they frequently struggle with computational overhead and limited representation power, particularly for subtle or complex tampering. In this paper, we propose M2SFormer, a novel Transformer encoder-based framework designed to overcome these challenges. Unlike approaches that process spatial and frequency cues separately, M2SFormer unifies multi-frequency and multi-scale attentions in the skip connection, harnessing global context to better capture diverse forgery artifacts. Additionally, our framework addresses the loss of fine detail during upsampling by utilizing a global prior map--a curvature metric indicating the difficulty of forgery localization--which then guides a difficulty-guided attention module to preserve subtle manipulations more effectively. Extensive experiments on multiple benchmark datasets demonstrate that M2SFormer outperforms existing state-of-the-art models, offering superior generalization in detecting and localizing forgeries across unseen domains. Our M2SFormer code is available in Github Link.