Event Probability Mask (EPM) and Event Denoising Convolutional Neural Network (EDnCNN) for Neuromorphic Cameras

R. Wes Baldwin, Mohammed Almatrafi, Vijayan Asari, Keigo Hirakawa; The IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), 2020, pp. 1701-1710

Abstract


This paper presents a novel method for labeling real-world neuromorphic camera sensor data by calculating the likelihood of generating an event at each pixel within a short time window, which we refer to as "event probability mask" or EPM. Its applications include (i) objective benchmarking of event denoising performance, (ii) training convolutional neural networks for noise removal called "event denoising convolutional neural network" (EDnCNN), and (iii) estimating internal neuromorphic camera parameters. We provide the first dataset (DVSNOISE20) of real-world labeled neuromorphic camera events for noise removal.

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[bibtex]
@InProceedings{Baldwin_2020_CVPR,
author = {Baldwin, R. Wes and Almatrafi, Mohammed and Asari, Vijayan and Hirakawa, Keigo},
title = {Event Probability Mask (EPM) and Event Denoising Convolutional Neural Network (EDnCNN) for Neuromorphic Cameras},
booktitle = {The IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR)},
month = {June},
year = {2020}
}