Extreme Point Supervised Instance Segmentation

Hyeonjun Lee, Sehyun Hwang, Suha Kwak; Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), 2024, pp. 17212-17222

Abstract


This paper introduces a novel approach to learning instance segmentation using extreme points i.e. the topmost leftmost bottommost and rightmost points of each object. These points are readily available in the modern bounding box annotation process while offering strong clues for precise segmentation and thus allows to improve performance at the same annotation cost with box-supervised methods. Our work considers extreme points as a part of the true instance mask and propagates them to identify potential foreground and background points which are all together used for training a pseudo label generator. Then pseudo labels given by the generator are in turn used for supervised learning of our final model. On three public benchmarks our method significantly outperforms existing box-supervised methods further narrowing the gap with its fully supervised counterpart. In particular our model generates high-quality masks when a target object is separated into multiple parts where previous box-supervised methods often fail.

Related Material


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[bibtex]
@InProceedings{Lee_2024_CVPR, author = {Lee, Hyeonjun and Hwang, Sehyun and Kwak, Suha}, title = {Extreme Point Supervised Instance Segmentation}, booktitle = {Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR)}, month = {June}, year = {2024}, pages = {17212-17222} }