Detection of Fusarium Damaged Kernels in Wheat Using Deep Semi-Supervised Learning on a Novel WheatSeedBelt Dataset

Keyhan Najafian, Lingling Jin, H. Randy Kutcher, Mackenzie Hladun, Samuel Horovatin, Maria Alejandra Oviedo-Ludena, Sheila Maria Pereira de Andrade, Lipu Wang, Ian Stavness; Proceedings of the IEEE/CVF International Conference on Computer Vision (ICCV) Workshops, 2023, pp. 660-669

Abstract


Fusarium head blight, caused by Fusarium spp., is a destructive disease of wheat worldwide. Fusarium damaged kernels (FDKs) significantly reduce grain yield and quality. Thus, FDK detection is a priority for wheat breeders seeking to develop high-grain quality and FDK-resistant wheat cultivars. However, traditional FDK measurement methods are time-consuming, labor-intensive, and of variable accuracy. Image-based phenotyping methods have the potential to efficiently detect FDK, but are challenging to develop due to the lack of large-scale damage-annotated wheat kernel datasets. Addressing this issue, we introduced WheatSeedBelt, a high-resolution large-scale dataset including 40,420 close-up top-and side-view single-kernel images of 268 wheat varieties with kernel damage annotations. Utilizing this dataset, we developed an image-processing pipeline to efficiently process images and extract the representative features for machine and deep-learning purposes. We also conducted three experiments on the dataset using pre-training and semi-supervised fine-tuning phases to classify wheat kernels into healthy, unhealthy but non-FDK, and FDK affected. Our best models achieved an F1-score of 84.29% for the Healthy-Unhealthy (including FDKs) task, 56.35% for the binary FDK-nonFDK, and 68.30% for the 3-class task (Healthy, Unhealthy, and FDK). We also conducted an inter-rater reliability study, which indicated that human experts do not outperform our model in FDK prediction, providing evidence that visual classification of FDK from RGB images is a challenging task.

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[bibtex]
@InProceedings{Najafian_2023_ICCV, author = {Najafian, Keyhan and Jin, Lingling and Kutcher, H. Randy and Hladun, Mackenzie and Horovatin, Samuel and Oviedo-Ludena, Maria Alejandra and de Andrade, Sheila Maria Pereira and Wang, Lipu and Stavness, Ian}, title = {Detection of Fusarium Damaged Kernels in Wheat Using Deep Semi-Supervised Learning on a Novel WheatSeedBelt Dataset}, booktitle = {Proceedings of the IEEE/CVF International Conference on Computer Vision (ICCV) Workshops}, month = {October}, year = {2023}, pages = {660-669} }