MultiADS: Defect-aware Supervision for Multi-type Anomaly Detection and Segmentation in Zero-Shot Learning

Ylli Sadikaj, Hongkuan Zhou, Lavdim Halilaj, Stefan Schmid, Steffen Staab, Claudia Plant; Proceedings of the IEEE/CVF International Conference on Computer Vision (ICCV), 2025, pp. 22978-22988

Precise optical inspection in industrial applications is crucial for minimizing scrap rates and reducing the associated costs. Besides merely detecting if a product is anomalous or not, it is crucial to know the distinct types of defects, such as a bent, cut, or scratch. The ability to recognize the "exact" defect type enables automated treatments of the anomalies in modern production lines. Current methods are limited to solely detecting whether a product is defective or not, without providing any insights into the defect type, but nevertheless detecting and identifying multiple defects. We propose MultiADS, a zero-shot learning approach, able to perform Multi-type Anomaly Detection and Segmentation. The architecture of MultiADS comprises CLIP and extra linear layers to align the visual and textual representation in a joint feature space. To the best of our knowledge, our proposal is the first approach to perform a multitype anomaly segmentation task in zero-shot learning. Contrary to the other baselines, our approach i) generates specific anomaly masks for each distinct defect type, ii) learns to distinguish defect types, and iii) simultaneously identifies multiple defect types present in an anomalous product. Additionally, our approach outperforms zero/few-shot learning SoTA methods on image-level and pixel-level anomaly detection and segmentation tasks on five commonly used datasets: MVTec-AD, Visa, MPDD, MAD, and Real-IAD.