CVPR 2023 Open Access Repository

Workshop on Vision-Based Industrial Inspection

Synthetic Data for Defect Segmentation on Complex Metal Surfaces: Juraj Fulir,

Lovro Bosnar,

Hans Hagen,

Petra Gospodnetić; [pdf] [supp]
[bibtex]
@InProceedings{Fulir_2023_CVPR, author = {Fulir, Juraj and Bosnar, Lovro and Hagen, Hans and Gospodneti\'c, Petra}, title = {Synthetic Data for Defect Segmentation on Complex Metal Surfaces}, booktitle = {Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) Workshops}, month = {June}, year = {2023}, pages = {4424-4434} }
Towards Sim-to-Real Industrial Parts Classification With Synthetic Dataset: Xiaomeng Zhu,

Talha Bilal,

Pär Mårtensson,

Lars Hanson,

Mårten Björkman,

Atsuto Maki; [pdf]
[bibtex]
@InProceedings{Zhu_2023_CVPR, author = {Zhu, Xiaomeng and Bilal, Talha and M\r{a}rtensson, P\"ar and Hanson, Lars and Bj\"orkman, M\r{a}rten and Maki, Atsuto}, title = {Towards Sim-to-Real Industrial Parts Classification With Synthetic Dataset}, booktitle = {Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) Workshops}, month = {June}, year = {2023}, pages = {4454-4463} }
Leveraging Multi-View Data for Improved Detection Performance: An Industrial Use Case: Faranak Shamsafar,

Sunil Jaiswal,

Benjamin Kelkel,

Kireeti Bodduna,

Klaus Illgner-Fehns; [pdf] [arXiv]
[bibtex]
@InProceedings{Shamsafar_2023_CVPR, author = {Shamsafar, Faranak and Jaiswal, Sunil and Kelkel, Benjamin and Bodduna, Kireeti and Illgner-Fehns, Klaus}, title = {Leveraging Multi-View Data for Improved Detection Performance: An Industrial Use Case}, booktitle = {Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) Workshops}, month = {June}, year = {2023}, pages = {4464-4471} }
What Makes a Good Data Augmentation for Few-Shot Unsupervised Image Anomaly Detection?: Lingrui Zhang,

Shuheng Zhang,

Guoyang Xie,

Jiaqi Liu,

Hua Yan,

Jinbao Wang,

Feng Zheng,

Yaochu Jin; [pdf] [arXiv]
[bibtex]
@InProceedings{Zhang_2023_CVPR, author = {Zhang, Lingrui and Zhang, Shuheng and Xie, Guoyang and Liu, Jiaqi and Yan, Hua and Wang, Jinbao and Zheng, Feng and Jin, Yaochu}, title = {What Makes a Good Data Augmentation for Few-Shot Unsupervised Image Anomaly Detection?}, booktitle = {Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) Workshops}, month = {June}, year = {2023}, pages = {4345-4354} }
Diversified and Multi-Class Controllable Industrial Defect Synthesis for Data Augmentation and Transfer: Jing Wei,

Fei Shen,

Chengkan Lv,

Zhengtao Zhang,

Feng Zhang,

Huabin Yang; [pdf]
[bibtex]
@InProceedings{Wei_2023_CVPR, author = {Wei, Jing and Shen, Fei and Lv, Chengkan and Zhang, Zhengtao and Zhang, Feng and Yang, Huabin}, title = {Diversified and Multi-Class Controllable Industrial Defect Synthesis for Data Augmentation and Transfer}, booktitle = {Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) Workshops}, month = {June}, year = {2023}, pages = {4445-4453} }
Glass Wool Defect Detection Using an Improved YOLOv5: Yizhou Jin,

Yu Lu,

Gang Zhou,

Qingjie Liu,

Yunhong Wang; [pdf]
[bibtex]
@InProceedings{Jin_2023_CVPR, author = {Jin, Yizhou and Lu, Yu and Zhou, Gang and Liu, Qingjie and Wang, Yunhong}, title = {Glass Wool Defect Detection Using an Improved YOLOv5}, booktitle = {Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) Workshops}, month = {June}, year = {2023}, pages = {4385-4394} }
Assigned MURA Defect Generation Based on Diffusion Model: Weizhi Liu,

Chang Liu,

Qiang Liu,

Dahai Yu; [pdf]
[bibtex]
@InProceedings{Liu_2023_CVPR, author = {Liu, Weizhi and Liu, Chang and Liu, Qiang and Yu, Dahai}, title = {Assigned MURA Defect Generation Based on Diffusion Model}, booktitle = {Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) Workshops}, month = {June}, year = {2023}, pages = {4395-4402} }
Unsupervised Automatic Defect Inspection Based on Image Matching and Local One-Class Classification: Chengkan Lv,

Zhengtao Zhang,

Fei Shen,

Feng Zhang; [pdf]
[bibtex]
@InProceedings{Lv_2023_CVPR, author = {Lv, Chengkan and Zhang, Zhengtao and Shen, Fei and Zhang, Feng}, title = {Unsupervised Automatic Defect Inspection Based on Image Matching and Local One-Class Classification}, booktitle = {Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) Workshops}, month = {June}, year = {2023}, pages = {4435-4444} }
XDNet: A Few-Shot Meta-Learning Approach for Cross-Domain Visual Inspection: Xian Yeow Lee,

Lasitha Vidyaratne,

Mahbubul Alam,

Ahmed Farahat,

Dipanjan Ghosh,

Teresa Gonzalez Diaz,

Chetan Gupta; [pdf]
[bibtex]
@InProceedings{Lee_2023_CVPR, author = {Lee, Xian Yeow and Vidyaratne, Lasitha and Alam, Mahbubul and Farahat, Ahmed and Ghosh, Dipanjan and Diaz, Teresa Gonzalez and Gupta, Chetan}, title = {XDNet: A Few-Shot Meta-Learning Approach for Cross-Domain Visual Inspection}, booktitle = {Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) Workshops}, month = {June}, year = {2023}, pages = {4375-4384} }
Towards Automated Polyp Segmentation Using Weakly- and Semi-Supervised Learning and Deformable Transformers: Guangyu Ren,

Michalis Lazarou,

Jing Yuan,

Tania Stathaki; [pdf] [supp]
[bibtex]
@InProceedings{Ren_2023_CVPR, author = {Ren, Guangyu and Lazarou, Michalis and Yuan, Jing and Stathaki, Tania}, title = {Towards Automated Polyp Segmentation Using Weakly- and Semi-Supervised Learning and Deformable Transformers}, booktitle = {Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) Workshops}, month = {June}, year = {2023}, pages = {4355-4364} }
How Do Label Errors Affect Thin Crack Detection by DNNs: Liang Xu,

Han Zou,

Takayuki Okatani; [pdf] [supp]
[bibtex]
@InProceedings{Xu_2023_CVPR, author = {Xu, Liang and Zou, Han and Okatani, Takayuki}, title = {How Do Label Errors Affect Thin Crack Detection by DNNs}, booktitle = {Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) Workshops}, month = {June}, year = {2023}, pages = {4414-4423} }
N-Pad: Neighboring Pixel-Based Industrial Anomaly Detection: JunKyu Jang,

Eugene Hwang,

Sung-Hyuk Park; [pdf] [supp]
[bibtex]
@InProceedings{Jang_2023_CVPR, author = {Jang, JunKyu and Hwang, Eugene and Park, Sung-Hyuk}, title = {N-Pad: Neighboring Pixel-Based Industrial Anomaly Detection}, booktitle = {Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) Workshops}, month = {June}, year = {2023}, pages = {4365-4374} }
Parcel3D: Shape Reconstruction From Single RGB Images for Applications in Transportation Logistics: Alexander Naumann,

Felix Hertlein,

Laura Dörr,

Kai Furmans; [pdf]
[bibtex]
@InProceedings{Naumann_2023_CVPR, author = {Naumann, Alexander and Hertlein, Felix and D\"orr, Laura and Furmans, Kai}, title = {Parcel3D: Shape Reconstruction From Single RGB Images for Applications in Transportation Logistics}, booktitle = {Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) Workshops}, month = {June}, year = {2023}, pages = {4403-4413} }